MALTA and monolithic active-pixel sensors
Monolithic active-pixel sensors combine charge collection, analog front ends, asynchronous event signalling, and digital periphery in the same technology. The research program asks how circuit behaviour, grouping, timing, and bandwidth interact before a hit becomes usable detector data.
Analog front ends and implementation
MALTA-2 and MALTA-3 front-end work connects detector-level requirements to low-voltage gain, threshold and calibration behaviour, device variability, layout extraction, timing, and measurement. TPSCo 65 nm implementation questions add process and parasitic constraints that cannot be resolved at the behavioural-model level alone.
Asynchronous readout and surrogate models
When events arrive without a global frame clock, grouping and merging create characteristic loss mechanisms. The program studies OR-merging loss, deterministic encoding cliffs, crossover rules, grouping, buffering, merger throughput, link allocation, and layout-aware delay. Analytic surrogates are calibrated against detailed simulation so architectural exploration remains tractable without losing the observable event-survival behaviour.
Explore the MALTA2 boundary-loss surrogate
Selected evidence and active work
Current collaborative program
MALTA-family analog front ends
Adrian Sibiga's co-supervised work with Thomas Koffas connects low-voltage detector requirements to analog front-end architecture, calibration, layout extraction, timing, and measurement for MALTA-2 and MALTA-3 contexts.
Current modelling program
Grouped asynchronous readout
Analytic and simulation-backed surrogates study how grouping, OR merging, encoding cliffs, buffering, merger delay, and link allocation affect hit survival in bandwidth-limited monolithic active-pixel-sensor readout.
Conference record · 2004
Differential active-pixel sensing
An earlier differential active-pixel-sensor publication provides historical continuity for the present return to monolithic sensors, while the contemporary program adds asynchronous event flow, layout-aware timing, and radiation-relevant CMOS constraints.
Radiation-aware design
Radiation-aware work considers process choice, device and layout effects, variability, fault tolerance, asynchronous operation, and the evidence needed to support stronger claims. Design for a radiation environment, simulated tolerance, irradiated behaviour, and formally qualified radiation-hard hardware are different levels of evidence and are reported separately.